关键词: 集成电路测试, 测试数据压缩, 动态字典, 选择编码

Abstract: A novel test data compression technique named CacheCompress is proposed. Different from the previous static dictionary based techniques, this dictionary is dynamic. During testing the dictionary is accessed by read and write operations and only needs to keep the most frequency used data thus to largely decrease the memory size requirement and eliminate the explicit dictionary initialization step. Experiments show that CacheCompress achieves 30% higher compression ratio than other recent compression schemes while the dictionary size dramatically reduces to 1‰.

Key words: ICtest, test data compression, dynamic dictionary, CacheCompress