北京大学学报(自然科学版)

研究C60-金属相互作用的一种新方法

赵文兵1, 吴军桥1, 陈军1, 吴克1, 张金龙1, 李传义1, 尹道乐1, 顾镇南2, 周锡煌2, 金朝霞2   

  1. 1北京大学物理学系,北京,100871;2北京大学化学系,北京,100871
  • 收稿日期:1995-05-30 出版日期:1996-01-20 发布日期:1996-01-20

A New Approach to Probe the Interactions between C60 and Non-Alkali-Metals

ZHAO Wenbing1, WU Junqiao1, CHEN Jun1, WU Ke1, ZHANG Jinlong1, LI Chuanyi1, YIN Daole1, GU Zhennan2, ZHOU Xihuang2, JIN Zhaoxia2   

  1. 1Department of Physics, Peking University, Beijing 100871; 2Department of Chemistry, Peking University, Beijing, 100871
  • Received:1995-05-30 Online:1996-01-20 Published:1996-01-20

摘要: 通过在超薄金属层上蒸镀C60时的电阻原位测量,我们发现在平均厚度约一个C60单层范围内样品电阻有明显可观测的变化,电阻变化的方向和幅度与金属层厚度以及金属材料的种类有关。这一新的现象揭示出有可能利用宏观物理性质测量来间接研究C60-金属界面相互作用,从而对常规微观谱测量的结果给出旁证和补充。

关键词: 薄膜, 界面相互作用, 电阻测量

Abstract: By measuring the resistance in situ during the deposition of C60 on ultrathin metal layers at UHV system, we find that the change of sample resistance is universal and it is very sensitive to the thickness of the precusor metal films and the characteristics of the employed metal materials. This sensitivity of resistance change in metal-C60 multilayers (bilayers) may be related to the charge transfer of metal to C60 and surface bonding effects, hence can be used as a newpossible approach to probe the interfacial interactions between C60 and metals.

Key words: thin film, interfacial interaction, resistance measurement

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