Acta Scientiarum Naturalium Universitatis Pekinensis ›› 2018, Vol. 54 ›› Issue (2): 293-298.DOI: 10.13209/j.0479-8023.2017.146

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An Analysis Method of System-Level ESD Model with a TLP Stress Input

WANG Yize, WANG Yuan, CAO Jian, ZHANG Xing   

  1. Key Laboratory of Microelectronic Devices and Circuits (MOE), Institute of Microelectronics, Peking University, Beijing 100871
  • Received:2016-12-15 Revised:2017-03-22 Online:2018-03-20 Published:2018-03-20
  • Contact: WANG Yuan, E-mail: wangyuan(at); ZHANG Xing, E-mail: zhx(at)


王艺泽, 王源, 曹健, 张兴   

  1. 教育部微电子器件与电路重点实验室, 北京大学微电子学研究院, 北京100871
  • 通讯作者: 王源, E-mail: wangyuan(at); 张兴, E-mail: zhx(at)
  • 基金资助:


Based on the existing equivalent formula of the transmission line pulse (TLP) and IEC 61000-4-2 stresses, the authors propose an analysis method of the system-level model with TLP stress as an input. Compared with the traditional analysis method under system-level IEC stress, the proposed method solves the issue that the calculation of the residual energy flowing into the device under test (DUT) is not accurate enough. Meanwhile, the prediction ability for the failure of the DUT is promoted. This work predicts the failure of the DUT under the mentioned two stresses through SPICE simulation. Furthermore, this work shows the validation through the measured results of the relevant printed circuit boards (PCBs), which confirms the promotion of the aforesaid prediction ability.

Key words: electro-static discharge (ESD), transmission line pulse (TLP) test, ESD gun, residual energy


基于已有的传输线脉冲发生器(TLP)与IEC 61000-4-2应力的等效关系, 提出一种以TLP应力作为输入的系统级模型分析方法。与传统的IEC应力作为系统输入的分析方法相比, 该方法解决了对流入待测器件(DUT)残余能量的计算不够精确的问题, 同时提高了DUT失效预测方面的精准性。通过SPICE仿真, 预测了上述两种应力作为系统输入的DUT失效情况。通过相应的印制电路板(PCB)的实测验证, 进一步说明新提出的方法能够提高系统级失效预测的精准性。

关键词: 静电放电, 传输线脉冲测试, 静电枪, 残余能量

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