北京大学学报自然科学版 ›› 2017, Vol. 53 ›› Issue (1): 50-56.DOI: 10.13209/j.0479-8023.2016.052

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钨酸钠与天然土状石墨在高温氩气氛围中的转化过程

魏霖荫, 传秀云(), 黄杜斌, 苏双青, 金时运   

  1. 北京大学地球与空间科学学院, 北京 100871
  • 收稿日期:2015-06-17 修回日期:2015-09-14 出版日期:2017-01-20 发布日期:2017-01-20
  • 通讯作者: 传秀云
  • 基金资助:
    国家自然科学基金(51274015)、国土资源部钨矿资源勘查与开发信息监测与分析项目(13GS03-01)、国家重点基础研究发展计划(2014CB846000)和北京大学开放测试基金(0000012321)资助

Transformation Process of Sodium Tungstata and Natural Graphite in Argon Atmosphere at High Temperature

Linyin WEI, Xiuyun CHUAN(), Dubin HUANG, Shuangqing SU, Shiyun JIN   

  1. School of Earth and Space Sciences, Peking University, Beijing 100871
  • Received:2015-06-17 Revised:2015-09-14 Online:2017-01-20 Published:2017-01-20
  • Contact: Xiuyun CHUAN

摘要:

以 Na2WO4为钨源, 天然土状石墨为碳源, 研究二者在高温氩气气氛下的转化过程及规律, 利用 X 射线衍射(XRD)、扫描电子显微镜(SEM)及电子能谱(EDS)对产物进行分析。结果表明, Na2WO4 与石墨的混合样品在氩气气氛下经高温处理, 可以生成不同的碳钨化合物。首先, 石墨与 Na2WO4 在接触界面发生还原反应, 将Na2WO4还原为α-W2C和β-W2C; 然后, 随着石墨增多, 当Na2WO4与石墨的质量比小于1:1时, 石墨开始将 α-W2C 还原为 α-WC, 直至 Na2WO4 与石墨的质量比为 1:5 时, 石墨可以将 α-W2C 完全转化为 α-WC。

关键词: 石墨, Na2WO4, WC, 高温处理, X射线衍射(XRD), 扫描电子显微镜(SEM), 电子能谱(EDS)

Abstract:

Using sodium tungstate as tungsten source, natural soil shaped graphite as carbon source, an experiment is provided for researching the transformation process and rules of them in argon atmosphere at high temperature. The final products are studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), energy dispersive spectrometer (EDS), etc. The result shows that the mixed samples of sodium tungstate and graphite can generate different tungsten carbon compounds in an argon atmosphere with heat treatment. First, reduction reaction occurs between mixed graphite and sodium tungstate dihydrate at the reaction interface, reducing sodium tungstate dihydrate to α-W2C and β-W2C. Second, when the mass ratio of Na2WO4 : C is less than 1:1, reduction of α-W2C to α-WC occurs, till the mass ratio was 1:5, and α-W2C can be reduced to α-WC completely.

Key words: graphite, sodium tungstate, tungsten carbide, high-temperature treatment, XRD, SEM, EDS

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