关键词: 面向应用的测试, 现场可编程门阵列, 自动测试向量生成, 查找表

Abstract: A novel scheme for application-dependent testing of FPGAs (field_programmable gate arrays) is proposed. This scheme models a design configuration (DC) of an FPGA as a network of LUTs(look-up-tables), non-LUT logic gates, flip-flops and interconnects, and the stuck-at faults on the interconnects (SAFIs) and the functional faults on the used LUTs (FFLs) are targeted. Two alternative types of test configurations (TCs) are proposed to improve the coverage of SAFIs obtained by automatic test pattern generation (ATPG) tools, while TCs under which exhaustive testing can be performed on the used LUTs are used to detect the FFLs. Experimental results show that, for the seven largest ISCAS89 benchmarks, this scheme can obtain the coverage ranging from 86.82% to 99.16% for the SAFIs, and 100% coverage for the FFLs.

Key words: application-dependent testing, FPGA, ATPG, LUT