关键词: 路径覆盖率, 数据流分析, 遗传算法, 模拟矢量自动生成

Abstract: The approaches of simulation-based validation need a large amount of simulation-vectors for verifying the corner cases of VLSI designs. The authors developed a validation platform of automatic simulation vectors generation based on the path coverage metric using genetic algorithm for RT-level designs. Given the critical signals, it used techniques of data flow analysis to acquire the critical path set and choose the critical path coverage to be the fitness function used in the GA. The authors performed experiments on some functional modules of Unity-863 SoC. The relationship between the final results and the control factors were also analyzed in detail. The results show that GATEST is effective and efficient.

Key words: path coverage, data flow analysis, genetic algorithm, automatic simulation vectors generation