北京大学学报(自然科学版)

用飞秒光克尔方法测量镶嵌在PVA膜的SnO纳米晶簇的三阶光学非线性

梁瑞生1,龚旗煌2,王树峰2,黄文涛2,王德煌2,程虎民3,马季铭3   

  1. 1华南师范大学信息光电子科技学院,广州,510631;2北京大学物理学院、人工微结构和介观物理国家重点实验室,北京,100871;3北京大学化学与分子工程学院,北京,100871
  • 收稿日期:2002-05-25 出版日期:2003-05-20 发布日期:2003-05-20

Large Third-Order Optical Nonlinearity of SnO2/PVA Composite Thin Film Measured by Femtosecond Optical Kerr Effect Method

LIANG Ruisheng1, GONG Qihuang2, WANG Shufeng2, HUANG Wentao2, WANG Dehuang2, CHENG Humin3, MA Jiming3   

  1. 1School for Information and Optoelectronic Science and Engineering, South China Normal University, Guangzhou, 510631; 2National Laboratory for Mesoscopic Physics and Physics School, Peking University, Beijing, 100871; 3College of Chemistry and Molecular Enginnering, Peking University, Beijing, 100871
  • Received:2002-05-25 Online:2003-05-20 Published:2003-05-20

摘要: 报道了用飞秒光克尔实验系统测量镶嵌在聚乙烯醇(PVA)薄膜的二氧化锡(SnO)纳米晶簇的光学非线性的实验结果,平均粒径为10nm和2~3nm的SnO晶簇的三阶非线性极化率 χ(3)分别为4.301×10-14和1.728×10-13esu,并对其原因进行了分析。实验还表明SnO/PVA薄膜的光学响应是很快的,为50fs。由于聚乙烯醇薄膜的性能稳定,易于生产,上述结果显示它可能成为制作光器件的优良基质。

关键词: 飞秒, 光学非线性, 克尔效应

Abstract: The third-order nonlinear susceptibility χ(3) of SnO2/PVA composite thin film was measured by a femtosecond time-resolved optical Kerr effect OKE at 810nm wavelength. The χ(3) observed was 4.301×10-14esu for SnO2 nanoparticles which average diameter is 10nm and 1.728×10-13esu for 2~3nm SnO2 nanoparticles. Femtosecond time-resolved OKE measurements revealed that the response time of the optical nonlinearity in SnO2/PVA thin film is extremely fast as short as 50fs.

Key words: Femtosecond, optical nonlinearity, Kerr effect

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