北京大学学报自然科学版 ›› 2021, Vol. 57 ›› Issue (2): 209-214.DOI: 10.13209/j.0479-8023.2020.099

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内部充放电监测器仿真及地面实验研究

宋思宇, 于向前, 陈鸿飞†, 陈傲, 施伟红, 邹鸿   

  1. 北京大学地球与空间科学学院空间物理与应用技术研究所, 北京 100871
  • 收稿日期:2020-03-10 修回日期:2020-09-14 出版日期:2021-03-20 发布日期:2021-03-20
  • 通讯作者: 陈鸿飞, E-mail: hfchen(at)pku.edu.cn
  • 基金资助:
    北京市自然科学基金(3184048)资助

Simulation and Ground Experiment of Deep Dielectric Charging Effect Monitor

SONG Siyu, YU Xiangqian, CHEN Hongfei†, CHEN Ao, SHI Weihong, ZOU Hong   

  1. Institute of Space Physics and Applied Technology, School of Earth and Space Sciences, Peking University, Beijing 100871
  • Received:2020-03-10 Revised:2020-09-14 Online:2021-03-20 Published:2021-03-20
  • Contact: CHEN Hongfei, E-mail: hfchen(at)pku.edu.cn

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摘要：

为了实现对航天器内部充放电效应的有效监测, 使用解析方法和有限元分析研究内部充放电监测器(DDCEM)内部电极层连接过孔的参数设计。结果表明, 当过孔绝缘区半径与焊盘半径之比大于2时, 可以忽略过孔对电子的泄露; 最大电位和最大电场强度均位于电极层与过孔焊盘的绝缘区; 当顶层电极输入电流达到最大量程时, DDCEM内部最大电场超过8×106 V/m, 存在放电风险。对DDCEM的电性能模拟测试和电子辐射测试结果表明, DDCEM测量结果在量程范围内具有很好的线性度, 当DDCEM受到电子辐射时, 能够监测到放电现象, 并通过计算可以得到放电电场为4×106 V/m, 超过介质的阈值电场(2×106 V/m), 说明DDCEM可以对内部充放电效应进行有效监测。

关键词: 内部充放电监测器, 内部充电电位, 泄漏电流, 解析方法, 有限元分析, 电性能测试, 电子辐射测试

Abstract:

In order to monitor the internal charging effect on spacecraft, analytical method and finite element analysis are used to study the parameter of the through holes in deep dielectric charging effect monitor (DDCEM). The result shows that when the radius of insulation area is more than 2 times as large as the radius of pad area, the leakage current from the through holes can be neglected. The maximum total electric field intensity located in the insulation area of the through holes exceeds 8×106 V/m, indicating the risk of internal discharging effect. Electric performance test and electron radiation test prove that DDCEM has a good linearity and can detect internal discharging effect. When a discharge occurs, the calculated electric field intensity is 4×106 V/m, which exceeds the threshold electric field 2×106 V/m. The result indicates that DDCEM is effective in monitoring the internal charging effect.

Key words: deep dielectric charging effect monitor, charging potential, leakage current, analytical method, finite element analysis, electric performance test, electron radiation test

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