A Built-In-Self Test Technique Based on Loopback for RF ICs

Acta Scientiarum Naturalium Universitatis Pekinensis

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A Built-In-Self Test Technique Based on Loopback for RF ICs

CUI Wei^1,2, FENG Jianhua¹, YE Hongfei¹, YAN Peng¹

1. Institute of Microelectronics, Peking University, Beijing 100871; 2. Key Lab of Integrated Microsystems Science Engineering and Application, Shenzhen Graduate School of Peking University, Shenzhen 518055;

Received:2013-04-03 Online:2014-07-20 Published:2014-07-20

一种基于环路结构的RFIC内建自测试方法

崔伟^1,2,冯建华¹,叶红飞¹,闫鹏¹

1. 北京大学微纳电子学系, 北京 100871; 2. 北京大学深圳研究生院集成微系统重点实验室, 深圳 518055;

Abstract

Abstract: A BIST (built-in self-test) technique based on Loopback test is presented. A programmable CMOS attenuator for BIST based on Loopback is designed. The testing results of RF transceiver with BIST circuits indicate that this technique can correctly detect system fault, and can be used in product testing, reducing the testing time and testing cost.

Key words: built-in self-test, Loopback, design for test, attenuator, RF IC, error vector magnitude

摘要： 提出一种基于环路(Loopback)测试的内建自测试(BIST)方法。为了基于环路结构的内建自测试, 设计了一种可编程CMOS衰减器。具有内建自测试(BIST)电路RF收发器的测试结果表明, 此方法能够正确检测出系统故障, 可以应用于生产测试, 并能减少测试时间和测试成本。

关键词: 内建自测试, Loopback, 可测性设计, 衰减器, 射频集成电路, 误差向量幅值(EVM)

CLC Number:

CUI Wei,FENG Jianhua,YE Hongfei,YAN Peng. A Built-In-Self Test Technique Based on Loopback for RF ICs[J]. Acta Scientiarum Naturalium Universitatis Pekinensis.

崔伟,冯建华,叶红飞,闫鹏. 一种基于环路结构的RFIC内建自测试方法[J]. 北京大学学报（自然科学版）.

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URL: https://xbna.pku.edu.cn/EN/

https://xbna.pku.edu.cn/EN/Y2014/V50/I4/709

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A Built-In-Self Test Technique Based on Loopback for RF ICs

一种基于环路结构的RFIC内建自测试方法

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