Acta Scientiarum Naturalium Universitatis Pekinensis

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A Novel Scheme for Application-Dependent Testing of FPGAs

LIN Teng, FENG Jianhua, ZHAO Jianbing, WANG Yangyuan   

  1. Department of Microelectronics, Peking University, Beijing 100871;
  • Received:2008-04-20 Online:2009-05-20 Published:2009-05-20



  1. 北京大学信息科学技术学院微电子学系,北京100871;

Abstract: A novel scheme for application-dependent testing of FPGAs (field_programmable gate arrays) is proposed. This scheme models a design configuration (DC) of an FPGA as a network of LUTs(look-up-tables), non-LUT logic gates, flip-flops and interconnects, and the stuck-at faults on the interconnects (SAFIs) and the functional faults on the used LUTs (FFLs) are targeted. Two alternative types of test configurations (TCs) are proposed to improve the coverage of SAFIs obtained by automatic test pattern generation (ATPG) tools, while TCs under which exhaustive testing can be performed on the used LUTs are used to detect the FFLs. Experimental results show that, for the seven largest ISCAS89 benchmarks, this scheme can obtain the coverage ranging from 86.82% to 99.16% for the SAFIs, and 100% coverage for the FFLs.

Key words: application-dependent testing, FPGA, ATPG, LUT

摘要: 提出一种新的面向应用的FPGA测试方法。该方法将FPGA设计配置(DC)抽象成由LUT、非LUT逻辑门、寄存器和互连线所组成的模型,将目标故障集设定为互连线的固定故障(SAFI)和LUT的功能故障(FFL)。提出了两种可选的测试配置(TC)以提高自动测试向量生成(ATPG)工具所得到的SAFI覆盖率,同时给出了可对LUT进行穷举测试的TC以检测FFL。实验结果表明,对于7个最大的ISCAS89基准电路,该方法可得到86.82%~99.16%的SAFI覆盖率和100%的FFL覆盖率。

关键词: 面向应用的测试, 现场可编程门阵列, 自动测试向量生成, 查找表

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